High-resolution wavefront sensing and aberration analysis of multi-spectral extreme ultraviolet beams

نویسندگان

چکیده

Coherent multi-spectral extreme ultraviolet beams have great potential for providing high spatial and temporal resolution microscopy spectroscopy applications. But due to the limitations of short-wavelength optics broad bandwidth, it remains a challenge perform quantitative, high-resolution beam characterization. Here we present wavefront sensing solution based on multiplexed ptychography, with which show spectrally resolved, reconstructions. Furthermore, using these high-fidelity quantitative measurements, investigate aberration transfer mechanisms in high-harmonic-generation process, where explain harmonic-order-dependent astigmatism inheritance from fundamental wavefront. This ptychographic concept thus enables detailed studies such as spatiotemporal effects attosecond pulse formation.

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ژورنال

عنوان ژورنال: Optica

سال: 2023

ISSN: ['2334-2536']

DOI: https://doi.org/10.1364/optica.478346